Elevating wafer topography & defect control with advanced Metro-Spection technology.
Category:
- Topographic Defects Inspection System
- Metrology and Inspection
Locations:
- Korea
- China
- Taiwan
- Japan
- Europe
- US
- SEA
Industry:
- HBM
- Memory (DRAM, NAND, 3D NAND)
- Advanced Packaging
- SOI
- Power Semiconductor
- Sensors (MEMS, Optoelectronics)
Brands:
- UNITY-SC®