Elevating wafer topography & defect control with advanced Metro-Spection technology.
Category:
- Metrology and Inspection
- Topographic Defects Inspection System
Locations:
- China
- Europe
- Japan
- Korea
- SEA
- Taiwan
Industry:
- HBM
- Power Semiconductor
- Sensors (MEMS, Optoelectronics)
- SOI
Brands:
- UNITY-SC®